Roughness effects on thin film physical properties
نویسنده
چکیده
The emergence of thin film nanoscience as an identifiable field of investigation parallels the development and adaptation of surface structural and chemical probes to provide in situ real-time atomic-scale data during film growth. The next step in this evolutionary process, which evolving right now, is the addition of theory and modeling as standard approaches, used in combination with the above physical tools, to complement, design, and analyze experiments. The beautifully hierarchical complexity associated with thin film micro-nanostructural and surface morphological evolution, which arises from a diverse set of competitive kinetic instabilities operating on very different time and length scales, assures that thin film nanoscience and technology will remain a vital and exciting field long into the future. Thus, an important part of my research focus is the following:
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